Boundary scan as a test solution in microelectronics curricula

Despite the importance of testing, most curricula in microelectronic systems are centered around design activities with marginal treatment of the testing phase. One explanation may be related to a high cost of Automated Test Equipment (ATE) and the lack of MOSIS-like testing infrastructure. Boundary scan provides an economical and hence attractive solution to the testing gap in education. The paper describes a philosophy and experience from the curriculum implemented at the University of New Hampshire (UNH). The presented model enables the comparison of testing activities using both classic and boundary scan approaches. For educational purposes, boundary scan testing appears to be sufficient and traditional ATE equipment becomes somewhat redundant