• DocumentCode
    2402176
  • Title

    Making ATE accessible for academic institutions

  • Author

    Moorhead, W. ; Demidenko, S.

  • fYear
    2002
  • fDate
    2002
  • Firstpage
    219
  • Lastpage
    222
  • Abstract
    Traditionally, automated test equipment (ATE) manufacturers have been producing test systems to meet the needs of the electronic industry and research organizations. There is however another fairly large ATE market that has not been addressed by ATE-educational institutes and universities. Issues related to the electronic test equipment for educational institutions are discussed in this paper. It identifies the requirements to implement a test engineering program in the university environment, the challenges that face both university and industry, and strategies that can be adopted to meet these requirements. It provides a general roadmap that allows customization to suit emerging test engineering developments that may occur future. Consideration is given to a pragmatic, and cost effective collaboration between the academic and industrial worlds
  • Keywords
    automatic test equipment; educational courses; electronic engineering education; ATE; academic institutions; automated test equipment; cost effective collaboration; customization; educational institutes; electronic test equipment; roadmap; test engineering developments; Automatic testing; Consumer electronics; Costs; Educational institutions; Electronic equipment manufacture; Electronic equipment testing; Electronics industry; Manufacturing automation; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
  • Conference_Location
    Christchurch
  • Print_ISBN
    0-7695-1453-7
  • Type

    conf

  • DOI
    10.1109/DELTA.2002.994618
  • Filename
    994618