DocumentCode :
2402176
Title :
Making ATE accessible for academic institutions
Author :
Moorhead, W. ; Demidenko, S.
fYear :
2002
fDate :
2002
Firstpage :
219
Lastpage :
222
Abstract :
Traditionally, automated test equipment (ATE) manufacturers have been producing test systems to meet the needs of the electronic industry and research organizations. There is however another fairly large ATE market that has not been addressed by ATE-educational institutes and universities. Issues related to the electronic test equipment for educational institutions are discussed in this paper. It identifies the requirements to implement a test engineering program in the university environment, the challenges that face both university and industry, and strategies that can be adopted to meet these requirements. It provides a general roadmap that allows customization to suit emerging test engineering developments that may occur future. Consideration is given to a pragmatic, and cost effective collaboration between the academic and industrial worlds
Keywords :
automatic test equipment; educational courses; electronic engineering education; ATE; academic institutions; automated test equipment; cost effective collaboration; customization; educational institutes; electronic test equipment; roadmap; test engineering developments; Automatic testing; Consumer electronics; Costs; Educational institutions; Electronic equipment manufacture; Electronic equipment testing; Electronics industry; Manufacturing automation; System testing; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location :
Christchurch
Print_ISBN :
0-7695-1453-7
Type :
conf
DOI :
10.1109/DELTA.2002.994618
Filename :
994618
Link To Document :
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