DocumentCode
2402176
Title
Making ATE accessible for academic institutions
Author
Moorhead, W. ; Demidenko, S.
fYear
2002
fDate
2002
Firstpage
219
Lastpage
222
Abstract
Traditionally, automated test equipment (ATE) manufacturers have been producing test systems to meet the needs of the electronic industry and research organizations. There is however another fairly large ATE market that has not been addressed by ATE-educational institutes and universities. Issues related to the electronic test equipment for educational institutions are discussed in this paper. It identifies the requirements to implement a test engineering program in the university environment, the challenges that face both university and industry, and strategies that can be adopted to meet these requirements. It provides a general roadmap that allows customization to suit emerging test engineering developments that may occur future. Consideration is given to a pragmatic, and cost effective collaboration between the academic and industrial worlds
Keywords
automatic test equipment; educational courses; electronic engineering education; ATE; academic institutions; automated test equipment; cost effective collaboration; customization; educational institutes; electronic test equipment; roadmap; test engineering developments; Automatic testing; Consumer electronics; Costs; Educational institutions; Electronic equipment manufacture; Electronic equipment testing; Electronics industry; Manufacturing automation; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location
Christchurch
Print_ISBN
0-7695-1453-7
Type
conf
DOI
10.1109/DELTA.2002.994618
Filename
994618
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