DocumentCode
2402368
Title
The effects of wipe on contact resistance of aged surfaces
Author
Malucci, Robert D.
Author_Institution
Molex Inc., Lisle, IL, USA
fYear
1994
fDate
17-19 Oct. 1994
Firstpage
131
Lastpage
144
Abstract
Probe measurements were made on corroded test coupons to show the effects wipe have on contact resistance. Data are provided for two types of films; oxidized copper and corrosion on porous gold due to flowing mixed gas tests (FMG). The results in both cases show contact resistance is reduced by nearly two orders of magnitude for 0.25 mm wipe. In addition, a Monte Carlo analysis was conducted using a modified version of a previously developed model of degradation. This included; adding film resistivity as a random variable for asperities that were previously considered non-conductive, and incorporating wipe in the model by considering shear forces to produce additional asperity deformation. The Monte Carlo results agree reasonably well with observation as differences can be explained within the framework of the model. It is believed improvements can be made on the predictions of the model if the mechanism of film removal and adhesion, and the variation of film resistivity are better understood.
Keywords
Monte Carlo methods; ageing; contact resistance; corrosion; oxidation; surface cleaning; Au; Cu; Monte Carlo analysis; adhesion; aged surfaces; asperity deformation; contact resistance; corrosion; degradation; film resistivity; flowing mixed gas tests; oxidized copper; porous gold; probes; shear forces; wipe; Aging; Conductivity; Contact resistance; Copper; Corrosion; Electrical resistance measurement; Monte Carlo methods; Probes; Surface resistance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 1994. Proceedings of the Fortieth IEEE Holm Conference on Electrical Contacts
Print_ISBN
0-7803-2133-2
Type
conf
DOI
10.1109/HOLM.1994.636830
Filename
636830
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