DocumentCode
2402392
Title
Investigation of nickel-nickel contacts in portable computer battery pack applications
Author
Lei, Kuan-Shaur ; Brownell, Paul V.
Author_Institution
Adv. Manuf. & Mater. Technol., Compaq Comput. Corp., Houston, TX, USA
fYear
1994
fDate
17-19 Oct. 1994
Firstpage
155
Lastpage
160
Abstract
Recent advances in the portable computer industry have increased the demands on battery pack performance and intensified interest in the long-term reliability of battery contacts. This paper characterizes the relation between contact resistance and force of the popular Ni-Ni contact interface at various stages of oxidation. The virgin Ni-Ni interface exhibited contact resistances of less than 30 mΩ at contact forces greater than 40 g. However, contacts exposed to a Battelle Class II mixed flowing gas (MFG) environment for up to six days and contacts subjected to 85°C/85% RH conditions for 500 bouts showed resistances as high as 200 Ω at 150 g and 1 kΩ at 100 g. The effects of repeated mating and wiping also were evaluated; fifty cycles of repeated mating at contact forces up to 150 g did not make a discernable difference but a single wipe at 150 g reduced the contact resistance significantly.
Keywords
cells (electric); computer power supplies; contact resistance; environmental degradation; nickel; oxidation; portable computers; 500 hour; 85 C; Battelle Class II mixed flowing gas; Ni-Ni; contact forces; contact resistance; mating; nickel-nickel contact interface; oxidation; portable computer battery pack; relative humidity; reliability; wiping; Aging; Application software; Batteries; Circuits; Computer aided manufacturing; Computer industry; Contact resistance; Electrical resistance measurement; Nickel; Portable computers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 1994. Proceedings of the Fortieth IEEE Holm Conference on Electrical Contacts
Print_ISBN
0-7803-2133-2
Type
conf
DOI
10.1109/HOLM.1994.636832
Filename
636832
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