• DocumentCode
    2402392
  • Title

    Investigation of nickel-nickel contacts in portable computer battery pack applications

  • Author

    Lei, Kuan-Shaur ; Brownell, Paul V.

  • Author_Institution
    Adv. Manuf. & Mater. Technol., Compaq Comput. Corp., Houston, TX, USA
  • fYear
    1994
  • fDate
    17-19 Oct. 1994
  • Firstpage
    155
  • Lastpage
    160
  • Abstract
    Recent advances in the portable computer industry have increased the demands on battery pack performance and intensified interest in the long-term reliability of battery contacts. This paper characterizes the relation between contact resistance and force of the popular Ni-Ni contact interface at various stages of oxidation. The virgin Ni-Ni interface exhibited contact resistances of less than 30 mΩ at contact forces greater than 40 g. However, contacts exposed to a Battelle Class II mixed flowing gas (MFG) environment for up to six days and contacts subjected to 85°C/85% RH conditions for 500 bouts showed resistances as high as 200 Ω at 150 g and 1 kΩ at 100 g. The effects of repeated mating and wiping also were evaluated; fifty cycles of repeated mating at contact forces up to 150 g did not make a discernable difference but a single wipe at 150 g reduced the contact resistance significantly.
  • Keywords
    cells (electric); computer power supplies; contact resistance; environmental degradation; nickel; oxidation; portable computers; 500 hour; 85 C; Battelle Class II mixed flowing gas; Ni-Ni; contact forces; contact resistance; mating; nickel-nickel contact interface; oxidation; portable computer battery pack; relative humidity; reliability; wiping; Aging; Application software; Batteries; Circuits; Computer aided manufacturing; Computer industry; Contact resistance; Electrical resistance measurement; Nickel; Portable computers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1994. Proceedings of the Fortieth IEEE Holm Conference on Electrical Contacts
  • Print_ISBN
    0-7803-2133-2
  • Type

    conf

  • DOI
    10.1109/HOLM.1994.636832
  • Filename
    636832