DocumentCode :
2402406
Title :
Image reconstruction based on expectation maximization method for electrical impedance tomography (EIT)
Author :
Wang, Qi ; Wang, Huaxiang
Author_Institution :
Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China
fYear :
2011
fDate :
17-18 May 2011
Firstpage :
50
Lastpage :
54
Abstract :
Electrical impedance tomography (EIT) aims to estimate the electrical properties at the interior of an object from current-voltage measurements on its boundary. The image reconstruction for EIT is an inverse problem, which is both nonlinear and ill-posed. The traditional regularization method cannot avoid producing artefacts in reconstructed images in the presence of oscillatory noise with negative portion. In different imaging between two different conductivity distributions, a conductivity change can be seen relatively non-negative to the medium with lower conductivity through some safeguard techniques. Therefore, the statistical method can be used for this purpose. In this paper, the expectation maximization (EM) method is used to solve the inverse problem for EIT. The mathematical model of EIT is transformed to the non-negatively constrained likelihood minimization problem. The solution is obtained by the gradient projection-reduced Newton (GPRN) iteration method. Simulation and experimental results indicate that the reconstructed images with higher quality can be obtained by the EM method.
Keywords :
Newton method; electric impedance imaging; electrical conductivity; expectation-maximisation algorithm; gradient methods; image reconstruction; inverse problems; medical image processing; tomography; EIT mathematical model; GPRN iteration method; conductivity change; conductivity distributions; electrical impedance tomography; expectation maximization method; gradient projection reduced Newton iteration method; ill posed inverse problem; image reconstruction; nonlinear inverse problem; nonnegatively constrained likelihood minimization problem; object boundary current-voltage measurements; object interior electrical properties; safeguard techniques; statistical method; Conductivity; Conductivity measurement; Image reconstruction; Inverse problems; Mathematical model; Tomography; Voltage measurement; electrical impedance tomography (EIT); expectation maximization (EM); image reconstruction; statistical method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Imaging Systems and Techniques (IST), 2011 IEEE International Conference on
Conference_Location :
Penang
Print_ISBN :
978-1-61284-894-5
Type :
conf
DOI :
10.1109/IST.2011.5962175
Filename :
5962175
Link To Document :
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