• DocumentCode
    2402798
  • Title

    Properties of output sequences and their use in guiding property-based test generation for synchronous sequential circuits

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of Electr. & Comput. Eng, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    377
  • Lastpage
    381
  • Abstract
    We show that output sequences produced by synchronous sequential circuits in response to test sequences that achieve high fault coverage have certain distinct properties. We demonstrate that these properties are useful as part of a property-based (simulation-based) test generation procedure. The importance of these properties is that they provide additional heuristics to drive property-based test generation, which to-date achieves the highest fault coverages reported for benchmark circuits. These additional heuristics are expected to improve the ability of property-based test generation procedures to achieve complete fault coverage in an efficient manner
  • Keywords
    automatic test pattern generation; fault diagnosis; logic simulation; logic testing; sequential circuits; benchmark circuits; fault coverage; heuristics; logic simulation; logic test; output sequences; property-based test generation; simulation-based test generation; synchronous sequential circuits; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Cities and towns; Genetics; Logic testing; Sequential analysis; Sequential circuits; Synchronous generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
  • Conference_Location
    Christchurch
  • Print_ISBN
    0-7695-1453-7
  • Type

    conf

  • DOI
    10.1109/DELTA.2002.994654
  • Filename
    994654