Test data compression using don´t-care identification and statistical encoding

Author

Kajihara, Seiji ; Taniguchi, Kenjiro ; Pomeranz, Irith ; Reddy, Sudhakar M.

Author_Institution

Dept. of Comput. Sci. & Electron., Kyushu Inst. of Technol., Japan

fYear

2002

fDate

2002

Firstpage

413

Lastpage

416

Abstract

This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified values of test vectors to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method could reduce test data volume to less than 40% of the original test sets

Keywords

Huffman codes; application specific integrated circuits; data compression; integrated circuit testing; logic testing; Huffman encoding; ISCAS-89 benchmark circuits; don´t-care identification; fault coverage; logic value reassignment; statistical encoding; system-on-chip design testing; test data compression; test data volume; test vectors; Benchmark testing; Binary codes; Circuit faults; Circuit testing; Data engineering; Electronic equipment testing; Encoding; Logic testing; System testing; Test data compression;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on

Conference_Location

Christchurch

Print_ISBN

0-7695-1453-7

Type

conf

DOI

10.1109/DELTA.2002.994661

Filename

994661