Title :
Test data compression using don´t-care identification and statistical encoding
Author :
Kajihara, Seiji ; Taniguchi, Kenjiro ; Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Comput. Sci. & Electron., Kyushu Inst. of Technol., Japan
Abstract :
This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified values of test vectors to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method could reduce test data volume to less than 40% of the original test sets
Keywords :
Huffman codes; application specific integrated circuits; data compression; integrated circuit testing; logic testing; Huffman encoding; ISCAS-89 benchmark circuits; don´t-care identification; fault coverage; logic value reassignment; statistical encoding; system-on-chip design testing; test data compression; test data volume; test vectors; Benchmark testing; Binary codes; Circuit faults; Circuit testing; Data engineering; Electronic equipment testing; Encoding; Logic testing; System testing; Test data compression;
Conference_Titel :
Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on
Conference_Location :
Christchurch
Print_ISBN :
0-7695-1453-7
DOI :
10.1109/DELTA.2002.994661
