Modulated phase-shifting for 3D scanning

We present a new 3D scanning method using modulated phase-shifting. Optical scanning of complex objects or scenes with significant global light transport, such as subsurface scattering, interreflections, volumetric scattering, etc. is a difficult task since the direct surface reflection will be mixed with the global illumination. The direct and global components can be effficiently separated using high frequency illumination which to some extend is done in traditional phase-shifting for 3D scanning. In this paper we introduce the concept of modulation based separation where a high frequency signal is multiplied on top of other signal. The modulated signal inherits the good separation properties of the high frequency signal and allows for removing artifacts due to global illumination. This technique can be used to clean up arbitrary projected signals, e.g. photographs as well as the sinusoid patterns used for phase-shifting. For the modulated phase-shifting, we propose a two-pass separation method exploiting high frequency patterns in two-dimensions that can filter out the global components much more completely than traditional one-pass separation methods. We demonstrate the effectiveness of our approach on a couple of scenes with significant subsurface scattering and interreflections.