Title :
A Comparison of DC and Transient Response Tests for Analogue Circuits
Author :
Taylor, D. ; Evans, P.S.A. ; Pritchard, T.I.
Author_Institution :
Sch. of Eng., Polytech. of Huddersfield, Huddersfield, UK
Abstract :
Transient Response Analysis [1] (TRA) is a quick and inexpensive method of testing analogue circuitry. In this paper we compare the effectiveness of traditional DC testing of analogue circuit cells with dynamic tests, using a simple analogue subcircuit element which models one component of a large mixed-signal ASIC.
Keywords :
analogue circuits; mixed analogue-digital integrated circuits; transient response; analogue circuit cells; analogue circuit testing; analogue subcircuit element; mixed-signal ASIC; traditional DC testing; transient response analysis; Analog computers; Application specific integrated circuits; Circuit testing; Controllability; Integrated circuit testing; Operational amplifiers; Registers; System testing; Transient analysis; Transient response;
Conference_Titel :
Solid-State Circuits Conference, 1992. ESSCIRC '92. Eighteenth European
Conference_Location :
Copenhagen
Print_ISBN :
87-984232-0-7
DOI :
10.1109/ESSCIRC.1992.5468407
