• DocumentCode
    2404110
  • Title

    Quasi-algebraic decompositions of switching functions

  • Author

    Stanion, Ted ; Sechen, Carl

  • Author_Institution
    Dept. of Electr. Eng., Washington Univ., USA
  • fYear
    1995
  • fDate
    27-29 Mar 1995
  • Firstpage
    358
  • Lastpage
    367
  • Abstract
    Brayton (1982-90) and others have developed a rich theory of decomposition of switching functions based on algebraic manipulations of monomials. In this theory, a product g(Xg)·h(Xh ) is algebraic if Xg∩Xh=Ø. There are efficient methods for determining if a function has an algebraic product. If a function does not have an algebraic product, then there are good methods for obtaining a decomposition of the form f=g·h+r where g·h is an algebraic product. Algebraic decompositions have the desirable properties that they are canonical and preserve testability. In this paper we generalize the concept of an algebraic product to decompositions of the form f(X)=g(Xg)??h(Xh) where ?? is any binary Boolean operation and |Xg∩Xh|=k for some k⩾0. We call these decompositions quasi-algebraic decompositions. We begin by showing that we may restrict ourselves to the case where ?? is +(sum),·(product) or ⊕ (enclusive-or). We then give necessary and sufficient conditions for a function to have a quasi-algebraic decomposition for a given Xg and Xh. If a function has such a decomposition we show how to determine the functions g and h in a canonical manner. We also show that these decompositions are fully SSL testable. Finally, using standard benchmark circuits, we show that quasi algebraic decompositions occur often and are useful in reducing circuit size
  • Keywords
    logic testing; minimisation of switching nets; state assignment; switching functions; SSL testable; algebraic product; benchmark circuits; binary Boolean operation; canonical manner; circuit size; quasi-algebraic decompositions; switching functions; testability; Benchmark testing; Circuit testing; Switching circuits; Taxonomy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Research in VLSI, 1995. Proceedings., Sixteenth Conference on
  • Conference_Location
    Chapel Hill, NC
  • Print_ISBN
    0-8186-7074-9
  • Type

    conf

  • DOI
    10.1109/ARVLSI.1995.515632
  • Filename
    515632