Title :
On-chip capacitor measurement for high performance microprocessor
Author_Institution :
IBM Corp., Austin, TX, USA
Abstract :
This paper describes a method to measure the dynamically changing on-chip capacitor of a high performance microprocessor while in operation. The capacitor´s effectiveness in controlling the core voltage supply is presented
Keywords :
capacitors; integrated circuit measurement; integrated circuit modelling; microprocessor chips; voltage control; capacitor effectiveness; core voltage supply control; dynamically changing on-chip capacitor measurement; high performance microprocessor; microprocessor; model extraction; on-chip capacitor measurement; Capacitors; Frequency domain analysis; Impedance; Microprocessors; Power measurement; Power supplies; RLC circuits; Semiconductor device measurement; System-on-a-chip; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1998. IEEE 7th Topical Meeting on
Conference_Location :
West Point, NY
Print_ISBN :
0-7803-4965-2
DOI :
10.1109/EPEP.1998.733751
