Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure

Author

Green, Christopher C. ; Seligman, J.M. ; Prince, John L. ; Virga, Kathleen L.

Author_Institution

Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA

fYear

1998

fDate

26-28 Oct 1998

Firstpage

69

Lastpage

72

Abstract

The frequency dependent loss tangent and dielectric constant has been determined for various dielectric materials using a stripline test fixture by employing differential and multiple-reflection-based measurement techniques with a vector network analyzer

Keywords

dielectric loss measurement; dielectric materials; electromagnetic wave reflection; integrated circuit measurement; integrated circuit packaging; integrated circuit testing; network analysers; permittivity measurement; strip lines; dielectric materials; differential measurement techniques; differential techniques; frequency dependent dielectric constant; frequency dependent dielectric packaging media; frequency dependent loss tangent; multiple-reflection techniques; multiple-reflection-based measurement techniques; stripline test fixture; stripline test structure; vector network analyzer; Circuit testing; Dielectric constant; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Frequency dependence; Materials testing; Packaging; Reflection; Stripline;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 1998. IEEE 7th Topical Meeting on

Conference_Location

West Point, NY

Print_ISBN

0-7803-4965-2

Type

conf

DOI

10.1109/EPEP.1998.733752

Filename

733752