DocumentCode
2404507
Title
Using markov models to compute probability of failed dangerous when repair times are not exponentially distributed
Author
Bukowski, Julia V.
Author_Institution
Dept. of Electr. & Comput. Eng., Villanova Univ., PA
fYear
2006
fDate
23-26 Jan. 2006
Firstpage
273
Lastpage
277
Abstract
Members of standards committees for safety instrumented systems (SIS) are debating the relative merits of different modeling techniques for assessing the appropriateness of safety system design. One argument against the use of Markov models is that they represent repair times by exponential densities but that repair times are not exponentially distributed. In this paper, we use a simple Markov model with typical non-exponential repair times and calculate, by simulation methods, both the transient and steady state probabilities of the failed dangerous detected (FDD) state over a range of values for failure rates. We compare these results to those obtained using two different Markov models that assume exponentially distributed repair times. We show that the steady state probabilities from all three models are identical though the transients show some differences. We conclude that, to the extent that steady state probability of the FDD state is considered an appropriate measure of system safety, simple Markov models with exponential repair-time densities can be used and will give the same results as more complicated non-exponential repair-time densities
Keywords
Markov processes; failure analysis; maintenance engineering; probability; safety systems; Markov models; exponential density; exponentially distributed repair times; failed dangerous detected state; failure rates; nonexponential repair times; safety instrumented systems; safety system design; simulation methods; steady state probability; transient probability; ANSI standards; Density functional theory; Density measurement; Distributed computing; IEC standards; Instruction sets; Instruments; Probability; Safety; Steady-state;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2006. RAMS '06. Annual
Conference_Location
Newport Beach, CA
ISSN
0149-144X
Print_ISBN
1-4244-0007-4
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2006.1677386
Filename
1677386
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