• DocumentCode
    2404577
  • Title

    The impurities diffusion in the semiconductors using the finite elements method

  • Author

    Schiopu, Paul ; Lakato, Eugen ; Degeratu, Vasile ; Stefan, Cornelia ; Ivan, S.

  • Author_Institution
    Bucharest Politehnica Univ., Romania
  • Volume
    2
  • fYear
    1998
  • fDate
    6-10 Oct 1998
  • Firstpage
    387
  • Abstract
    The finite elements method is a very efficient research and development tool, with many utilizations and different applications. This paper presents the impurities diffusion in the semiconductors using the finite elements method, starting from the similitude between the equation that describes the heat conduction in solids and the diffusion equations
  • Keywords
    diffusion; finite element analysis; semiconductors; finite element method; heat conduction; impurity diffusion; semiconductor; Analytical models; Character generation; Finite element methods; Integral equations; Numerical models; Physics; Semiconductor impurities; Solids; Temperature distribution; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-4432-4
  • Type

    conf

  • DOI
    10.1109/SMICND.1998.733769
  • Filename
    733769