Title :
Low dimensional silicon for integrated optoelectronics
Author :
Nassiopoulou, Androula G.
Author_Institution :
Inst. of Microelectron., NCSR Demokritos, Athens, Greece
Abstract :
In contrast to bulk silicon, which is an indirect gap semiconductor, with very low efficiency in radiation emission, low dimensional silicon structures (quantum dots or wires) can emit light with very high efficiency at room temperature. The best known form of low dimensional silicon is porous silicon but other materials of low dimensional silicon, in the form of nanocrystallites or nanowires within insulating matrices, can be fabricated. Their application in silicon based optoelectronics is a challenging one. In this respect, both materials and fabrication techniques need to be compatible with the existing silicon technology. In this paper, the fabrication and properties of low dimensional silicon (nanowires in the form of silicon nanopillars on bulk crystalline silicon and nanocrystallites deposited on thin SiO2 layers) will be discussed
Keywords :
electroluminescence; elemental semiconductors; nanostructured materials; photoluminescence; semiconductor quantum wires; silicon; Si; fabrication; insulating matrix; integrated optoelectronics; light emission; low-dimensional silicon; nanocrystallite; nanopillar; nanowire; quantum wire; semiconductor; Crystalline materials; Insulation; Integrated optoelectronics; Nanowires; Optical device fabrication; Quantum dots; Semiconductor materials; Silicon; Temperature; Wires;
Conference_Titel :
Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-4432-4
DOI :
10.1109/SMICND.1998.733772