DocumentCode :
2404881
Title :
BDD based analysis of parametric fault trees
Author :
Codetta-Raiteri, D.
Author_Institution :
Dipt. di Informatica, Torino Univ.
fYear :
2006
fDate :
23-26 Jan. 2006
Firstpage :
442
Lastpage :
449
Abstract :
Several extensions of the fault tree (FT) formalism have been proposed in the literature. One of them is called parametric fault tree (PFT) and is oriented to the modeling of redundant systems, and provides a compact form to model the redundant parts of the system. Using PFTs instead of FTs to model systems with replicated parts, the model design is simplified since the analyst can fold subtrees with the same structure in a single parametric subtree, reducing the number of elements in the model. The method based on binary decision diagrams (BDD) for the quantitative analysis of FTs, is adapted in this paper to cope with the parametric form of PFTs: an extension of BDDs called parametric BDD (pBDD) is used to analyze PFTs. The solution process is simplified by using pBDDs: comparing the pBDD obtained from a PFT, with the ordinary BDD obtained from the unfolded FT, we can observe a reduction of the number of nodes inside the pBDD. Such reduction is proportional to the level of redundancy inside the PFT and leads to a consequent reduction of the number of steps necessary to perform the analysis. Concerning the qualitative analysis, we can observe that several minimal cut sets (MCS) obtained from the FT model of a redundant system, involve basic events relative to similar components. A parametric MCS (pMCS) allows to group such MCSs in an equivalence class, and consequently, to evidence only the failure pattern, regardless the identity of replicated components. A method to derive pMCSs from a PFT is provided in the paper
Keywords :
binary decision diagrams; fault trees; reliability theory; binary decision diagram; equivalence class; failure pattern; minimal cut set; parametric fault tree; parametric subtree; redundant system; replicator component; Binary decision diagrams; Boolean functions; Data structures; Fault trees; Performance analysis; Petri nets; Redundancy; State-space methods; Stochastic processes; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2006. RAMS '06. Annual
Conference_Location :
Newport Beach, CA
ISSN :
0149-144X
Print_ISBN :
1-4244-0007-4
Electronic_ISBN :
0149-144X
Type :
conf
DOI :
10.1109/RAMS.2006.1677414
Filename :
1677414
Link To Document :
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