DocumentCode :
2405121
Title :
Method to increase the thermal stability of the heating circuits
Author :
Draghici, F. ; Mitu, F. ; Dilimot, G. ; Enache, I.
Author_Institution :
Bucharest Politehnica Univ., Romania
Volume :
2
fYear :
1998
fDate :
6-10 Oct 1998
Firstpage :
501
Abstract :
This paper presents a new method for thermal stabilization in electrically heated ovens. Using this technique we develop a heating system for thermal characterization of the high temperature silicon carbide devices
Keywords :
high-temperature electronics; ovens; semiconductor device testing; semiconductor materials; silicon compounds; thermal stability; SiC; electrical heating; heating circuit; high temperature testing; oven; silicon carbide device; thermal stability; Artificial intelligence; Circuit stability; Cooling; Delay effects; Heating; Ovens; Probes; Temperature control; Temperature dependence; Thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-4432-4
Type :
conf
DOI :
10.1109/SMICND.1998.733795
Filename :
733795
Link To Document :
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