DocumentCode :
2405165
Title :
A frequency agile 40 Gb/s half rate linear phase detector for data jitter measurement
Author :
Karlquist, Richard ; Marshall, Todd ; Tuyl, R.V. ; Hutchinson, Craig
Author_Institution :
Agilent Technol., Palo Alto, CA, USA
fYear :
2005
fDate :
30 Oct.-2 Nov. 2005
Abstract :
A 40 Gb/s half-rate linear phase detector IC for NRZ data, implemented in a 200 GHz fT, InP DHBT process, with a novel architecture, is described. The IC can be used for clock recovery or jitter measurement. The new architecture has less critical internal timing, and better speed and linearity than previous phase detectors. Half rate operation doubles the allowable propagation delay. Dual outputs alternate in time and combine linearly, allowing overlap without error, resulting in greater linear range. Operation at any rate is possible because no rate-specific delay lines are used. The intrinsic jitter for a 40 Gb/s 231-1 PRBS pattern is 50 mUl pk-pk in a 320 MHz bandwidth.
Keywords :
III-V semiconductors; data communication; frequency agility; heterojunction bipolar transistors; indium compounds; jitter; phase detectors; synchronisation; 200 GHz; 320 MHz; 40 Gbit/s; DHBT process; InP; NRZ data; clock recovery; data communication; data jitter measurement; frequency agile; half rate linear phase detector; Clocks; Frequency measurement; Indium phosphide; Jitter; Linearity; Optical signal processing; Phase detection; Phase frequency detector; Phase measurement; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium, 2005. CSIC '05. IEEE
Print_ISBN :
0-7803-9250-7
Type :
conf
DOI :
10.1109/CSICS.2005.1531747
Filename :
1531747
Link To Document :
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