Title :
Mineral insulated heating cable sheath temperature test methods and design optimization techniques
Author :
McGrath, Blair ; Thorat, Sudhir ; Brady, George ; Jurchuk, Ron ; Loiselle, Richard ; Derworiz, Ron
Author_Institution :
Tyco Thermal Controls, Trenton, ON, Canada
Abstract :
Methods to measure and predict maximum sheath temperatures of mineral insulated (MI) heating cable vary by testing agency, standards writing body and manufacturer. This has resulted in confusion in the industry about the best approach to predict sheath temperatures of MI heat tracing cables. This paper presents an analysis of two different test methods for sheath temperature prediction. The test methods studied are commonly known in the industry as the `pipe test´ and the `plate test´. The paper demonstrates that the pipe test has significant variation in the measured sheath temperatures in successive test runs while the plate test produces a much more repeatable and accurate result. The paper proposes the use of the plate test as a preferred method to measure and predict maximum sheath temperature. As a related topic, the paper also presents general considerations for optimizing designs that will reduce costs and improve constructability of electrical heat tracing designs using MI heat tracing cables. A case study is presented to demonstrate application of these design optimization techniques.
Keywords :
cable sheathing; electric heating; insulated wires; optimisation; power cable insulation; temperature measurement; Ml heat tracing cables; cable sheath temperature test; constructability; design optimization; electrical heat tracing designs; mineral insulated heating cable; pipe test; plate test; sheath temperature measurement; Cable insulation; Cable shielding; Heating; Minerals; Temperature measurement; AIT; Mineral insulated (MI) heating cable; electric heat tracing; electric trace heating; pipe test; plate test; sheath temperature;
Conference_Titel :
Petroleum and Chemical Industry Conference (PCIC), 2011 Record of Conference Papers Industry Applications Society 58th Annual IEEE
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-61284-299-8
DOI :
10.1109/PCICon.2011.6085896