• DocumentCode
    2405317
  • Title

    Computer simulation of surface barrier solar cells with microrelief interface

  • Author

    Dmitruk, N.L. ; Borkovskaya, O.Yu. ; Mamontova, I.B. ; Rengevych, O.V.

  • Author_Institution
    Inst. for Phys. of Semicond., Acad. of Sci., Kiev, Ukraine
  • Volume
    2
  • fYear
    1998
  • fDate
    6-10 Oct 1998
  • Firstpage
    535
  • Abstract
    An original numerical simulator was developed, which provides a 1D self-consistent solution for Poisson´s equation and continuity equations for electrons and holes. This simulator uses the boundary conditions at the interface taking into account the surface (interface) recombination, the above-barrier transport of major carriers and Schockley-Read recombination in the space charge region. For calculation of electron-hole pairs generation rate the special spectral dependence of the reflection coefficient of light was used, that is characteristic for microrelief interface of metal-semiconductor structure. The morphology and statistical geometric properties of interface were investigated by atomic force microscopy (AFM)
  • Keywords
    interface structure; reflectivity; semiconductor device models; semiconductor-metal boundaries; solar cells; surface recombination; 1D self-consistent solution; Poisson equation; Schockley-Read recombination; atomic force microscopy; boundary condition; computer simulation; continuity equation; electron-hole pair generation; interface morphology; interface recombination; light reflection coefficient; major carrier transport; metal-semiconductor structure; microrelief interface; space charge region; spectral dependence; surface barrier solar cell; surface recombination; Atomic force microscopy; Boundary conditions; Charge carrier processes; Computational modeling; Computer simulation; Numerical simulation; Photovoltaic cells; Poisson equations; Spontaneous emission; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1998. CAS '98 Proceedings. 1998 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-4432-4
  • Type

    conf

  • DOI
    10.1109/SMICND.1998.733806
  • Filename
    733806