DocumentCode :
2405368
Title :
300 GHz InP DHBT large signal model including current blocking effect and validated by Gilbert multiplier circuits
Author :
Lai, J.W. ; Caruth, D. ; Chuang, Y.J. ; Cimino, K. ; Elder, R. ; Jansen, D. ; Stroili, F. ; Le, M. ; Feng, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear :
2005
fDate :
30 Oct.-2 Nov. 2005
Abstract :
This paper describes a modeling approach for Vitesse VIP2 300 GHz InP/InGaAs DHBT technology, including the nonlinear effects in base-collector region covering current blocking, velocity modulation and self-heating. Model is verified in terms of single devices and integrated circuits. Good model fitting to measured DC and S-parameters data from single HBTs is achieved, and several circuits based on Gilbert multiplier are designed for the purposes of model validation and high-speed applications. Nonlinear properties of these circuits are measured and compared with the simulation results from different bipolar transistor models. The variable gain amplifier reported in this paper achieves the highest gain-bandwidth product of over 520 GHz under the limitation of measurement capability.
Keywords :
III-V semiconductors; S-parameters; bipolar integrated circuits; gallium arsenide; heterojunction bipolar transistors; indium compounds; integrated circuit modelling; millimetre wave bipolar transistors; multiplying circuits; semiconductor device models; submillimetre wave amplifiers; 300 GHz; Gilbert multiplier circuits; InP DHBT; InP-InGaAs; InP/InGaAs DHBT technology; S-parameters; Vitesse VIP2 DHBT technology; base-collector region; bipolar transistor models; current blocking effect; gain-bandwidth product; heterojunction bipolar transistors; high-frequency amplifiers; high-speed integrated circuits; large signal model; nonlinear effects; nonlinear properties; self heating; variable gain amplifier; velocity modulation; Bipolar transistors; Circuit simulation; DH-HEMTs; Gain; Indium gallium arsenide; Indium phosphide; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit technology; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium, 2005. CSIC '05. IEEE
Print_ISBN :
0-7803-9250-7
Type :
conf
DOI :
10.1109/CSICS.2005.1531758
Filename :
1531758
Link To Document :
بازگشت