Optical, optomechanical, and optoelectronic design and operational testing of a multi-stage optical backplane demonstration system

Author

Plant, D.V. ; Robertson, B. ; Hinton, H.S. ; Ayliffe, M.H. ; Boisset, G.C. ; Goodwill, D.J. ; Kabal, D. ; Iyer, R. ; Liu, Y.S. ; Rolston, D.R. ; Venditti, M. ; Szmanski, T.H. ; Robertson, W.M. ; Taghizadeh, M.R.

Author_Institution

Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada

fYear

1996

fDate

27-29 Oct 1996

Firstpage

306

Lastpage

312

Abstract

In this paper, we describe the optical, optomechanical, and optoelectronic design of a multistage optical backplane demonstration system. In addition, operational testing and performance is discussed

Keywords

asynchronous transfer mode; integrated optoelectronics; optical computing; optical interconnections; photonic switching systems; printed circuit design; printed circuit testing; ATM switching systems; PC boards; asynchronous transfer mode; multi-stage optical backplane demonstration system testing; multistage optical backplane demonstration system; operational testing; optical computing; optoelectronic design; optomechanical design; performance; printed circuit board optical backplanes; Asynchronous transfer mode; Backplanes; High speed optical techniques; Optical arrays; Optical design; Optical interconnections; Optical receivers; Optical transmitters; Smart pixels; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Massively Parallel Processing Using Optical Interconnections, 1996., Proceedings of the Third International Conference on

Conference_Location

Maui, HI

Print_ISBN

0-8186-7591-8

Type

conf

DOI

10.1109/MPPOI.1996.559114

Filename

559114