Title :
Losses in multilevel crossover in VLSI interconnects
Author :
Datta, P.K. ; Sanyal, S. ; Bhattacharya, D.
Author_Institution :
Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
Abstract :
The radiation and surface wave losses may give rise to electromagnetic interference (EMI) problems in high speed VLSI interconnects. Over and above this there will be dielectric and conductor losses. These losses have been evaluated for multilevel interconnects by finite difference time domain (FDTD) technique. The crosstalk between lines in the same level as well as in different levels and propagation delays are also found
Keywords :
VLSI; crosstalk; delays; electromagnetic interference; finite difference time-domain analysis; high-speed integrated circuits; integrated circuit interconnections; integrated circuit modelling; losses; EMI; VLSI interconnects; conductor losses; crosstalk; dielectric losses; electromagnetic interference; finite difference time domain technique; high speed VLSI; multilevel crossover; propagation delays; radiation losses; surface wave losses; Conductors; Crosstalk; Dielectric losses; Electromagnetic interference; Electromagnetic radiation; Finite difference methods; Propagation delay; Surface waves; Time domain analysis; Very large scale integration;
Conference_Titel :
Design Automation Conference, 2002. Proceedings of ASP-DAC 2002. 7th Asia and South Pacific and the 15th International Conference on VLSI Design. Proceedings.
Conference_Location :
Bangalore
Print_ISBN :
0-7695-1441-3
DOI :
10.1109/ASPDAC.2002.994905
