Title :
Physics of GaN-based heterostructure field effect transistors
Author :
Shur, Michael S. ; Gaska, Remis
Author_Institution :
Dept. of Electr. & Comput. Sci. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fDate :
30 Oct.-2 Nov. 2005
Abstract :
GaN-based field effect transistors might replace other compound semiconductor FETs in microwave and, possibly, even in millimeter and submillimeter wave applications. New device physics of these devices (primarily linked to their wurtzite symmetry and to small nitrogen mass) has to be understood to facilitate this process. In this paper, we review the new physics of polarization, electron transport, and gate leakage, and current collapse in these devices.
Keywords :
III-V semiconductors; gallium compounds; microwave field effect transistors; millimetre wave field effect transistors; submillimetre wave transistors; GaN; compound semiconductor; current collapse; device physics; electron transport; field effect transistors; gate leakage; nitrogen mass; polarization physics; wurtzite symmetry; Electrons; FETs; HEMTs; MODFETs; Microwave devices; Millimeter wave devices; Nitrogen; Physics; Polarization; Submillimeter wave devices;
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium, 2005. CSIC '05. IEEE
Print_ISBN :
0-7803-9250-7
DOI :
10.1109/CSICS.2005.1531788