DocumentCode :
2405847
Title :
Physics of GaN-based heterostructure field effect transistors
Author :
Shur, Michael S. ; Gaska, Remis
Author_Institution :
Dept. of Electr. & Comput. Sci. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
2005
fDate :
30 Oct.-2 Nov. 2005
Abstract :
GaN-based field effect transistors might replace other compound semiconductor FETs in microwave and, possibly, even in millimeter and submillimeter wave applications. New device physics of these devices (primarily linked to their wurtzite symmetry and to small nitrogen mass) has to be understood to facilitate this process. In this paper, we review the new physics of polarization, electron transport, and gate leakage, and current collapse in these devices.
Keywords :
III-V semiconductors; gallium compounds; microwave field effect transistors; millimetre wave field effect transistors; submillimetre wave transistors; GaN; compound semiconductor; current collapse; device physics; electron transport; field effect transistors; gate leakage; nitrogen mass; polarization physics; wurtzite symmetry; Electrons; FETs; HEMTs; MODFETs; Microwave devices; Millimeter wave devices; Nitrogen; Physics; Polarization; Submillimeter wave devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium, 2005. CSIC '05. IEEE
Print_ISBN :
0-7803-9250-7
Type :
conf
DOI :
10.1109/CSICS.2005.1531788
Filename :
1531788
Link To Document :
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