DocumentCode
2405847
Title
Physics of GaN-based heterostructure field effect transistors
Author
Shur, Michael S. ; Gaska, Remis
Author_Institution
Dept. of Electr. & Comput. Sci. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fYear
2005
fDate
30 Oct.-2 Nov. 2005
Abstract
GaN-based field effect transistors might replace other compound semiconductor FETs in microwave and, possibly, even in millimeter and submillimeter wave applications. New device physics of these devices (primarily linked to their wurtzite symmetry and to small nitrogen mass) has to be understood to facilitate this process. In this paper, we review the new physics of polarization, electron transport, and gate leakage, and current collapse in these devices.
Keywords
III-V semiconductors; gallium compounds; microwave field effect transistors; millimetre wave field effect transistors; submillimetre wave transistors; GaN; compound semiconductor; current collapse; device physics; electron transport; field effect transistors; gate leakage; nitrogen mass; polarization physics; wurtzite symmetry; Electrons; FETs; HEMTs; MODFETs; Microwave devices; Millimeter wave devices; Nitrogen; Physics; Polarization; Submillimeter wave devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductor Integrated Circuit Symposium, 2005. CSIC '05. IEEE
Print_ISBN
0-7803-9250-7
Type
conf
DOI
10.1109/CSICS.2005.1531788
Filename
1531788
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