• DocumentCode
    2405847
  • Title

    Physics of GaN-based heterostructure field effect transistors

  • Author

    Shur, Michael S. ; Gaska, Remis

  • Author_Institution
    Dept. of Electr. & Comput. Sci. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2005
  • fDate
    30 Oct.-2 Nov. 2005
  • Abstract
    GaN-based field effect transistors might replace other compound semiconductor FETs in microwave and, possibly, even in millimeter and submillimeter wave applications. New device physics of these devices (primarily linked to their wurtzite symmetry and to small nitrogen mass) has to be understood to facilitate this process. In this paper, we review the new physics of polarization, electron transport, and gate leakage, and current collapse in these devices.
  • Keywords
    III-V semiconductors; gallium compounds; microwave field effect transistors; millimetre wave field effect transistors; submillimetre wave transistors; GaN; compound semiconductor; current collapse; device physics; electron transport; field effect transistors; gate leakage; nitrogen mass; polarization physics; wurtzite symmetry; Electrons; FETs; HEMTs; MODFETs; Microwave devices; Millimeter wave devices; Nitrogen; Physics; Polarization; Submillimeter wave devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium, 2005. CSIC '05. IEEE
  • Print_ISBN
    0-7803-9250-7
  • Type

    conf

  • DOI
    10.1109/CSICS.2005.1531788
  • Filename
    1531788