Title :
Scheduling for IC sort and test
Author :
Chang, Tsu-Shuan ; Chen, Tsung-Rian ; Chen, Cheng-Wu
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
Abstract :
An integer programming formulation and the Lagrangian relaxation approach are used to solve a class of scheduling problems for integrated circuit (IC) sort and test. It provides a lower bound on the cost, which can be used to measure the suboptimality of feasible schedules. A numerical example is also given to illustrate the potential of the approach
Keywords :
integer programming; integrated circuit manufacture; integrated circuit testing; production control; production testing; IC sort; IC test; Lagrangian relaxation approach; feasible schedules; integer programming formulation; suboptimality; Circuit testing; Costs; Integrated circuit measurements; Integrated circuit testing; Lagrangian functions; Linear programming; Packaging machines; Processor scheduling; Semiconductor device measurement; Sorting;
Conference_Titel :
Decision and Control, 1992., Proceedings of the 31st IEEE Conference on
Conference_Location :
Tucson, AZ
Print_ISBN :
0-7803-0872-7
DOI :
10.1109/CDC.1992.371145
