Title :
An architectural level energy reduction technique for deep-submicron cache memories
Author :
Ishihara, Tohru ; Asada, Kunihiro
Author_Institution :
VLSI Design & Educ. Center, Tokyo Univ., Japan
Abstract :
An architectural level technique for a high performance and low energy cache memory is proposed in this paper. The key idea of our approach is to divide a cache memory into several number of cache blocks and to activate a few parts of the cache blocks. The threshold voltage of each cache block is dynamically changed according to the utilization of each block. Frequently accessed cache blocks are woken up and others are put to sleep by controlling the threshold voltage. Since time overhead to change the threshold voltage can not be neglected, predicting a cache block which will be accessed in the next cycle is important. A history based prediction technique to predict cache blocks which should be woken up is also proposed. Experimental results demonstrated that the leakage energy dissipation in cache memories optimized by this approach can be less than 5% of energy dissipation in a cache memory which does not employ the approach
Keywords :
cache storage; integrated circuit design; logic design; low-power electronics; memory architecture; storage management; voltage control; architectural level energy reduction technique; architectural level technique; cache block access prediction; cache block activation; cache block utilization; cache blocks; cache memories; cache memory; dynamically changed threshold voltage; frequently accessed cache blocks; history based prediction technique; leakage energy dissipation; threshold voltage; time overhead; Cache memory; Circuits; Digital systems; Energy dissipation; History; Leakage current; Sleep; Threshold voltage; Very large scale integration; Voltage control;
Conference_Titel :
Design Automation Conference, 2002. Proceedings of ASP-DAC 2002. 7th Asia and South Pacific and the 15th International Conference on VLSI Design. Proceedings.
Conference_Location :
Bangalore
Print_ISBN :
0-7695-1441-3
DOI :
10.1109/ASPDAC.2002.994935