On De-Embedding Phase for High Speed Connectors

The phase error problem in de-embedding is examined for board structures and devices under test (DUT). The main feature of this paper is the comparison between the S-parameter data for the embedded DUT and the data for a judiciously chosen reference situation. It is important to note that de-embedding the phase is essential in the design of high-speed connectors in consumer electronics hardware, especially in providing "swappable" models for high-end microprocessor-based applications.