Title :
Recombination and loss mechanisms in GaNAsP/GaP QW lasers
Author :
Hossain, N. ; Chamings, J. ; Jin, S.R. ; Sweeney, S.J. ; Liebich, S. ; Reinhard, S. ; Volz, K. ; Kunert, B. ; Stolz, W.
Author_Institution :
Adv. Technol. Inst., Univ. of Surrey, Guildford, UK
Abstract :
In this paper the authors present a comprehensive study of the threshold current and its temperature dependence in novel direct band-gap Ga(NAsP)/GaP QW lasers which provide a potential route to lattice matched monolithic integration of long term stable semiconductor lasers on silicon. It is found that near room temperature, the threshold current is dominated by nonradiative recombination accounting for ~87% of the total threshold current density. A strong increase in threshold current with hydrostatic pressure implies that a carrier leakage path is the dominant carrier recombination mechanism.
Keywords :
III-V semiconductors; arsenic compounds; electron-hole recombination; gallium compounds; nitrogen compounds; quantum well lasers; semiconductor quantum wells; Ga(NAsP)-GaP; QW lasers; carrier leakage path; carrier recombination; lattice matched monolithic integration; long term stable semiconductor lasers; loss; threshold current; Radiative recombination; Semiconductor lasers; Silicon; Temperature dependence; Temperature measurement; Threshold current;
Conference_Titel :
Photonics Global Conference (PGC), 2010
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-9882-6
DOI :
10.1109/PGC.2010.5706060