DocumentCode

2406882

Title

Film head domain observations at wafer processing level

Author

Tong, H.C. ; Tayamballi, P. ; Bischoff, P. ; Shelor, R. ; Cormier, A.

Author_Institution

Read-Rite Corporation

fYear

1992

fDate

13-16 April 1992

Firstpage

6

Lastpage

6

Keywords

Bars; Frequency; Kerr effect; Magnetic heads; Magnetostriction; Micromagnetics; Microscopy; Probes; Shape; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 1992. Digests of Intermag '92., International

Conference_Location

St. Louis, MO, USA

Print_ISBN

0-7803-0637-6

Type

conf

DOI

10.1109/INTMAG.1992.696189

Filename

696189