Title :
Dynamic field distribution of thin film inductive heads
Author :
Takano, H. ; Sasaki, S. ; Shinada, H. ; Shiiki, K. ; Sugita, Y.
Author_Institution :
Hitachi, Ltd.
Keywords :
Amorphous magnetic materials; Degradation; Delay; Eddy currents; Frequency response; Magnetic field measurement; Magnetic films; Magnetic heads; Saturation magnetization; Transistors;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696190