DocumentCode
2408557
Title
Thermal noise limits in nanoscale electronics
Author
Mudrow, M. ; Wanalertlak, W. ; Forbes, L.
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR
fYear
0
fDate
0-0 0
Lastpage
40
Abstract
An analysis of thermal noise predicts the number of bit errors per year caused by noise in nanoscale electronic memories and processors will be excessive. Noise it seems has already imposed a fundamental limit on the speed of microprocessors. No significant advance in microprocessor speeds is anticipated due not only to power limitations but also noise limits
Keywords
error statistics; integrated circuit noise; integrated memory circuits; logic testing; microprocessor chips; nanoelectronics; bit error rates; logic error rates; memory error rates; microprocessor speeds; nanoscale electronic memories; nanoscale electronic processors; thermal noise limits; Bit error rate; CMOS logic circuits; Circuit noise; Error analysis; Logic circuits; Microprocessors; Noise level; Thermal resistance; Threshold voltage; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics and Electron Devices, 2006. WMED '06. 2006 IEEE Workshop on
Conference_Location
Boise, ID
Print_ISBN
1-4244-0374-X
Type
conf
DOI
10.1109/WMED.2006.1678299
Filename
1678299
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