DocumentCode :
2408945
Title :
Stress distribution of thin circular quartz qafer and force sensitive characteristic experiments of resonator
Author :
Luo, Bing ; Tian, Wenjie ; Zou, Shufang
Author_Institution :
Res. Centre of Sensor Technol., Beijing Inf. Sci. & Technol. Univ., Beijing, China
fYear :
2009
fDate :
15-16 May 2009
Firstpage :
325
Lastpage :
328
Abstract :
An ANSYS analysis and computation of the stress distribution in circular AT cut quartz wafer was carried out, when quartz wafer was subjected to a force along its diameter which was parallel to the x axis, the force-frequency coefficient of quartz resonator were tested by using plated electrode on different region. Experiment proves that the result of ANSYS analysis is nearly consistent with experiment, and the maximum error is 0.36%. Therefore, when a resonator is designed on the same circular quartz, by using the finite element method, electrode may be set at the limited scope to choose positions of the notable force-frequency coefficient according to the stress distribution of the wafer. The integrated quartz resonator of the prominent force-frequency coefficient can be obtained.
Keywords :
crystal resonators; finite element analysis; finite element method; force sensitive characteristic; force-frequency coefficient; quartz resonator; stress distribution; thin circular quartz wafer; Azimuth; Force measurement; Force sensors; Frequency conversion; Frequency measurement; Pressure measurement; Resonant frequency; Sensor phenomena and characterization; Strain measurement; Stress measurement; ANSYS analysis; force-frequency; quartz crystal; resonator; sensitivity coefficient;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Mechatronics and Automation, 2009. ICIMA 2009. International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-3817-4
Type :
conf
DOI :
10.1109/ICIMA.2009.5156627
Filename :
5156627
Link To Document :
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