DocumentCode :
2408955
Title :
Semiconductor challenges
Author :
Cuomo, Andrea
fYear :
2003
fDate :
2003
Firstpage :
8
Lastpage :
8
Keywords :
Europe; Integrated circuit technology; Photonics; Secure storage; Security; Technological innovation; Technology management; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN :
1530-1591
Print_ISBN :
0-7695-1870-2
Type :
conf
DOI :
10.1109/DATE.2003.1253579
Filename :
1253579
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2408955
