DocumentCode
2409002
Title
Application of FIB circuit edit combined with TIVA in advanced failure analysis
Author
Zhu, David ; Neo, S.P. ; Loh, S.K. ; Er, Eddie
Author_Institution
Failure Anal. Group, Chartered Semicond. Manuf. Ltd., Singapore
fYear
2008
fDate
7-11 July 2008
Firstpage
1
Lastpage
4
Abstract
This paper presented a failure analysis methodology to overcome the difficulties of fault location encountered by pin leakage and some testing parameter failures in a mixed signal device. These types of failure generally cannot be solved by traditional electrical failure analysis methods.
Keywords
failure analysis; fault location; focused ion beam technology; integrated circuit reliability; integrated circuit testing; mixed analogue-digital integrated circuits; FIB circuit edit; TIVA; advanced failure analysis; fault location; mixed signal device; pin leakage; thermal induced voltage altering; Circuit faults; Circuit testing; Failure analysis; Fault diagnosis; Ion beams; Laser beams; Laser transitions; Pins; Silicon on insulator technology; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the
Conference_Location
Singapore
Print_ISBN
978-1-4244-2039-1
Electronic_ISBN
978-1-4244-2040-7
Type
conf
DOI
10.1109/IPFA.2008.4588147
Filename
4588147
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