• DocumentCode
    2409054
  • Title

    Characteristics of coplanar waveguide on sapphire for high temperature applications (25 to 400° C)

  • Author

    Ponchak, George E. ; Jordan, Jennifer L. ; Scardelletti, Maximilian ; Stalker, Amy R.

  • Author_Institution
    NASA Glenn Res. Center, Cleveland
  • fYear
    2007
  • fDate
    9-12 Oct. 2007
  • Firstpage
    925
  • Lastpage
    928
  • Abstract
    This paper presents the characteristics of coplanar waveguide transmission lines fabricated on R-plane sapphire substrates as a function of temperature across the temperature range of 25 to 400degC. Effective permittivity and attenuation are measured on a high temperature probe station. Two techniques are used to obtain the transmission line characteristics, a Thru-Reflect-Line calibration technique that yields the propagation coefficient and resonant stubs. To a first order fit of the data, the effective permittivity and the attenuation increase linearly with temperature.
  • Keywords
    attenuation measurement; coplanar transmission lines; coplanar waveguides; permittivity measurement; sapphire; R-plane sapphire substrates; coplanar waveguide transmission lines; high temperature applications; high temperature probe station; temperature 25 C to 400 C; thru-reflect-line calibration technique; Attenuation; Calibration; Circuits; Coplanar waveguides; Gallium nitride; Permittivity measurement; Silicon carbide; Substrates; Temperature distribution; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2007. European
  • Conference_Location
    Munich
  • Print_ISBN
    978-2-87487-001-9
  • Type

    conf

  • DOI
    10.1109/EUMC.2007.4405345
  • Filename
    4405345