DocumentCode
2409159
Title
Reduced delay uncertainty in high performance clock distribution networks
Author
Velenis, Dimitrios ; Papaefthymiou, Marios C. ; Friedman, Eby G.
Author_Institution
Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
fYear
2003
fDate
2003
Firstpage
68
Lastpage
73
Abstract
The design of clock distribution networks in synchronous digital systems presents enormous challenges. Controlling the clock signal delay in the presence of various noise sources, process parameter variations, and environmental effects represents a fundamental problem in the design of high speed synchronous circuits. A polynomial time algorithm that improves the tolerance of a clock distribution network to process and environmental variations is presented in this paper. The algorithm generates a clock tree topology that minimizes the uncertainty of the clock signal delay to the most critical data paths. Strategies for enhancing the physical layout of the clock tree to decrease delay uncertainty are also presented. Application of the methodology on benchmark circuits demonstrates clock tree topologies with decreased delay uncertainties of up to 90%. Techniques to enhance a clock tree layout have been applied on a set of benchmark circuits, yielding a reduction in delay uncertainty of up to 48%.
Keywords
circuit optimisation; clocks; delays; integrated circuit design; integrated circuit noise; logic design; logic simulation; network topology; clock distribution network tolerance; clock signal delay control; clock tree topology; delay uncertainty reduction; environmental effects; high performance clock distribution networks; high speed synchronous circuits; noise sources; polynomial time algorithm; process parameter variations; signal delay uncertainty minimization; synchronous digital systems; Circuit noise; Circuit topology; Clocks; Delay effects; Digital systems; Polynomials; Signal design; Signal processing; Uncertainty; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN
1530-1591
Print_ISBN
0-7695-1870-2
Type
conf
DOI
10.1109/DATE.2003.1253589
Filename
1253589
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