• DocumentCode
    2409843
  • Title

    Theoretical study on a new information entropy and its use in attribute reduction

  • Author

    Luo, Ping ; He, Qing ; Shi, Zhongzhi

  • Author_Institution
    Key Lab. of Intelligent Inf. Process., Chinese Acad. of Sci., Beijing, China
  • fYear
    2005
  • fDate
    8-10 Aug. 2005
  • Firstpage
    73
  • Lastpage
    79
  • Abstract
    The positive region in rough set framework and Shannon conditional entropy are two traditional uncertainty measurements, used usually as heuristic metrics in attribute reduction. In this paper first a new information entropy is systematically compared with Shannon entropy, which shows its competence of another new uncertainty measurement. Then given a decision system we theoretically analyze the variance of these three metrics under two reverse circumstances, Those are when condition (decision) granularities merge while decision (condition) granularities remain unchanged. The conditions that keep these measurements unchanged in the above different situations are also figured out. These results help us to give a new information view of attribute reduction and propose more clear understanding of the quantitative relations between these different views, defined by the above three uncertainty measurements. It shows that the requirement of reducing a condition attribute in new information view is more rigorous than the ones in the latter two views and these three views are equivalent in a consistent decision system.
  • Keywords
    entropy; rough set theory; Shannon conditional entropy; attribute reduction; condition granularity; decision granularity; decision system; heuristic metrics; information entropy; rough set framework; uncertainty measurement; Algebra; Analysis of variance; Computers; Information entropy; Information processing; Laboratories; Machine learning; Measurement uncertainty; Merging; Set theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cognitive Informatics, 2005. (ICCI 2005). Fourth IEEE Conference on
  • Print_ISBN
    0-7803-9136-5
  • Type

    conf

  • DOI
    10.1109/COGINF.2005.1532617
  • Filename
    1532617