The PCB defect inspection system design based on lab windows/CVI

Author

Fen, Wang ; Xuemei, Li ; Gang, Xu

Author_Institution

Sch. of Mechatron. & Control Eng., Shenzhen Univ., Shenzhen, China

fYear

2009

fDate

15-16 May 2009

Firstpage

485

Lastpage

487

Abstract

A novel approach used for Printed Circuit Board (PCB) defect inspection is presented in this paper. This image processing approach that developed in Lab Windows/CVI can be used to determine whether PCB components are put in the correct location, and matches areas of inspection to a template of valid components. The experimental result shows that the proposed approach can search the correct components in PCB image with a given template, therefore it can be used in an automatic optical inspection for online inspection.

Keywords

automatic optical inspection; flaw detection; image matching; printed circuit manufacture; printed circuit testing; virtual instrumentation; Lab Windows/CVI; PCB defect inspection system design; PCB image matching; automatic optical inspection; image processing; online inspection; Automatic control; Automatic optical inspection; Histograms; Image processing; Manufacturing industries; Manufacturing processes; Mechatronics; Pattern matching; Printed circuits; Production; LabWindows/CVI; PCB; defect; image; inspection; pattern matching;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Mechatronics and Automation, 2009. ICIMA 2009. International Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-3817-4

Type

conf

DOI

10.1109/ICIMA.2009.5156669

Filename

5156669