Disturbing effects of microwave probe on mm-Wave antenna pattern measurements

Author

Reniers, A.C.F. ; van Dommele, A.R. ; Huang, M.D. ; Herben, M.H.A.J.

Author_Institution

Electromagn. Group, Eindhoven Univ. of Technol. (TU/e), Eindhoven, Netherlands

fYear

2014

fDate

6-11 April 2014

Firstpage

161

Lastpage

164

Abstract

In order to be able to measure and validate an antenna design in the mm-wave frequency range it must be connected to a Vector Network Analyzer or Spectrum Analyzer. One of the challenges is to interconnect such a small antenna and the measurement equipment without influencing the antenna measurements. A commonly used method for interconnection is making use of a connector or a probe. The problem is that the connector as well as the probe are often many times larger than the antenna under test itself and are located close to the radiating part of the antenna structure. This means that the antenna measurements will be influenced. Therefore, the paper focuses on the disturbing effects of the probe as a reflective and obstructive object on mm-wave antenna pattern measurements, specifically in the 60 GHz band, and how they can be reduced.

Keywords

antenna radiation patterns; antenna testing; microwave antennas; millimetre wave antennas; millimetre wave measurement; network analysers; spectral analysers; antenna structure; antenna under test; connector; disturbing effects; frequency 60 GHz; measurement equipment; microwave probe on mm-Wave antenna pattern measurements; mm-wave frequency range; spectrum analyzer; vector network analyzer; Antenna measurements; Antenna radiation patterns; Microwave antennas; Probes; Reflector antennas; 60 GHz; LCP; antenna pattern measurements; bent PCB; microwave probe; mm-wave;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation (EuCAP), 2014 8th European Conference on

Conference_Location

The Hague

Type

conf

DOI

10.1109/EuCAP.2014.6901717

Filename

6901717