• DocumentCode
    2410607
  • Title

    Single event effects test and analysis results from the Boeing Radiation Effects Laboratory (BREL)

  • Author

    Wert, J.L. ; Normand, E. ; Oberg, D.L. ; Underwood, D.C. ; Vallejo, M. ; Kouba, C. ; Page, T.E. ; Perry, W.M.

  • Author_Institution
    Boeing Co., Seattle, WA, USA
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    13
  • Lastpage
    19
  • Abstract
    We describe the results of single event effects testing conducted by the Boeing Radiation Effects Laboratory on a variety of devices. The data include SEU, SEL and SEFI cross sections induced by both heavy ions and protons.
  • Keywords
    proton effects; semiconductor device testing; Boeing Radiation Effects Laboratory; SEFI cross sections; SEL cross sections; SEU cross sections; heavy ion effects; proton effects; single event effects testing; Aerospace testing; EPROM; Electronic equipment testing; Laboratories; Nondestructive testing; PROM; Performance evaluation; Radiation effects; Telephony; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2005. IEEE
  • Print_ISBN
    0-7803-9367-8
  • Type

    conf

  • DOI
    10.1109/REDW.2005.1532659
  • Filename
    1532659
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2410607