Title :
Recent single event effects results for candidate spacecraft electronics for NASA
Author :
O´Bryan, Martha V. ; LaBel, Kenneth A. ; Kniffin, Scott D. ; Poivey, Christian ; Howard, James W., Jr. ; Ladbury, Ray L. ; Buchner, Stephen P. ; Oldham, Timothy R. ; Marshall, Paul W. ; Sanders, Anthony B. ; Kim, Hak S. ; Hawkins, Donald K. ; Carts, Marti
Author_Institution :
Muniz Eng. Inc., Greenbelt, MD, USA
Abstract :
Vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.
Keywords :
proton effects; semiconductor device testing; space vehicle electronics; digital devices; heavy ion induced single event effects; hybrid devices; linear bipolar devices; proton induced single event effects; spacecraft electronics; Aerospace electronics; Aerospace engineering; Cyclotrons; NASA; Protons; Single event upset; Space vehicles; Test facilities; Testing; USA Councils;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532661
