• DocumentCode
    2410683
  • Title

    Test results of single-event effects conducted by the Jet Propulsion Laboratory

  • Author

    Trom, F. ; Miyahira, Tetsuo F.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    36
  • Lastpage
    41
  • Abstract
    This paper reports recent single-event effects results for a variety of microelectronic devices that include ADC, DAC, DDS, MOSFET driver, analog switch, oscillator, and zero delay buffer. The data was collected to evaluate these devices for possible use in NASA spacecraft. Six of ten devices under study were sensitive to SEL, and the latchup was destructive.
  • Keywords
    CMOS integrated circuits; integrated circuit testing; radiation effects; space vehicle electronics; Jet Propulsion Laboratory; NASA spacecraft; destructive latchup; microelectronic devices; single-event effects; Delay effects; Laboratories; MOSFET circuits; Microelectronics; NASA; Oscillators; Propulsion; Space vehicles; Switches; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2005. IEEE
  • Print_ISBN
    0-7803-9367-8
  • Type

    conf

  • DOI
    10.1109/REDW.2005.1532662
  • Filename
    1532662
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2410683