• DocumentCode
    2410739
  • Title

    Dynamic single event upset characterization of the Virtex-IIPro´s embedded IBM PowerPC405 using proton irradiation

  • Author

    Chayab, Fayez ; Hiemstra, David M. ; Ronge, Roman

  • Author_Institution
    MDA Corp., Brampton, Ont., Canada
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    51
  • Lastpage
    56
  • Abstract
    The proton induced dynamic SEU cross-section of the IBM PowerPC405 embedded in Xilinx´s Virtex-IIPro FPGAs is reported. This upset cross-section is then used to estimate upset rates in the space radiation environment.
  • Keywords
    IBM computers; SRAM chips; embedded systems; field programmable gate arrays; integrated circuit testing; proton effects; SRAM chips; Virtex-IIPro FPGA system; Virtex-IIPro embedded IBM PowerPC405; dynamic single event upset characterization; field programmable gate arrays; proton induced dynamic SEU cross-section; proton irradiation effects; space radiation environment; upset rate estimation; Application software; Field programmable gate arrays; Hardware; Logic; Particle beams; Protons; Random access memory; Single event upset; Telephony; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2005. IEEE
  • Print_ISBN
    0-7803-9367-8
  • Type

    conf

  • DOI
    10.1109/REDW.2005.1532665
  • Filename
    1532665
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2410739