• DocumentCode
    2410758
  • Title

    Heavy ion and proton see characterization of COTS 0.22μm field programmable gate arrays

  • Author

    Koga, R. ; Crawford, K. ; Yu, P. ; George, J. ; Crain, S. ; Zakrzewski, M. ; Wang, J.J.

  • Author_Institution
    Aerosp. Corp., El Segundo, CA
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    57
  • Lastpage
    64
  • Abstract
    Single event effect vulnerabilities of currently available commercial-off-the-shelf (COTS) field programmable gate arrays (FPGAs) have been measured. They are compared with those observed in older COTS devices as well as with some radiation hardened devices
  • Keywords
    field programmable gate arrays; integrated circuit testing; proton effects; 0.22 micron; commercial-off-the-shelf field programmable gate arrays; heavy ion SEE characterization; proton SEE characterization; radiation effects; single event effect vulnerability; single event effects; Clocks; Counting circuits; Field programmable gate arrays; Foundries; Frequency; Protons; Radiation hardening; Shift registers; Space technology; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2005. IEEE
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-9367-8
  • Type

    conf

  • DOI
    10.1109/REDW.2005.1532666
  • Filename
    1532666
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2410758