Title :
Single event upset characterization of the ESP603 single board space computer with the PowerPC603r processor using proton irradiation
Author :
Rufenacht, Hermann ; Hiemstra, David M. ; Ronge, Roman ; Klincsek, Tom ; Le, Kim Anh ; Gazdewich, Jerome
Author_Institution :
EMS Technol. Canada Ltd., St. Anne de Bellevue, Que., Canada
Abstract :
The proton induced SEU cross-sections measured in a dynamic test of the ESP603 Power PC 603r processor are presented. The cross-sections are used to estimate upset rates in the space radiation environment.
Keywords :
integrated circuit testing; microcomputers; microprocessor chips; proton effects; space vehicle electronics; ESP603 single board space computer; PowerPC603r processor; proton induced SEU cross-sections; proton irradiation effects; single event upset characterization; space radiation environment; upset rate estimation; Application software; Circuit testing; Computerized monitoring; Control systems; Low earth orbit satellites; Medical services; Protons; Single event upset; Software testing; Telephony;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532668
