Title :
COTS ADC & DAC selection and qualification for the GLAST mission
Author :
Ampe, J. ; Thai, V. ; Buchner, S. ; Kniffin, S. ; Johnson, W.N.
Author_Institution :
Praxis Inc., Alexandria, VA, USA
Abstract :
Low-voltage low-power ADCs were radiation tested for selection to use on calorimeter instrument of the gamma-ray large area space telescope (GLAST). The GLAST instrument detects the most energetic photons, gamma rays, and pinpoint their source direction and energy. The GLAST instrument has a low-Earth orbit with an expected lifetime total-dose radiation exposure less than 5 krad. Both the Maxim MAX145 and MAX1241 CMOS ADCs were tested to be single event latchup (SEL) immune to an LET of 60 Mev/mg/cm2. The MAX145 is used on the GLAST instrument. A companion device MAX5121 was selected as the flight DAC that also did not show SEL to 60 MeV/mg/cm2. In presenting the data from all the ADCs and DACs tested, and explaining our test and qualification process, we hope to aide other designers with this difficult process.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; digital-analogue conversion; integrated circuit testing; low-power electronics; radiation effects; space vehicle electronics; COTS ADC selection; COTS DAC selection; GLAST mission; MAX1241 CMOS ADC system; MAX5121 device; Maxim MAX145 CMOS ADC system; analog-digital conversion; calorimeter instrument; digital-analog conversion; gamma-ray large area space telescope; linear energy transfer; low Earth orbit GLAST instrument; low-voltage low-power ADC; radiation testing; semiconductor device radiation effects; single event latchup; total-dose radiation exposure; Digital-analog conversion; Gamma ray detection; Gamma ray detectors; Gamma rays; Instruments; Position measurement; Pulse measurements; Qualifications; Telescopes; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532670
