Title :
Supervisory circuits in a mixed neutron and gamma radiation environment
Author :
Zong, Y. ; Franco, F.J. ; Cachero, A.H. ; Agapito, J.A. ; Fernandes, A.C. ; Marques, J.G. ; Rodríguez-Ruiz, M.A. ; Casas-Cubillos, J.
Author_Institution :
Dep. Fisica Aplicada III, Univ. Complutense de Madrid, Spain
Abstract :
This paper describes the evolution of different commercial microprocessor supervisory circuits under neutron and gamma radiation. After the irradiation, the tested devices showed some interesting changes: an increase of supply current and the period of watchdog timer. It was also observed that threshold voltage hysteresis and the shift of TTL trigger level appeared in some devices.
Keywords :
gamma-ray effects; hysteresis; integrated circuit testing; microprocessor chips; neutron effects; reference circuits; TTL trigger level shift; microprocessor supervisory circuits; mixed neutron-gamma radiation environment; supply current increase; threshold voltage hysteresis; watchdog timer; Circuit testing; Clocks; Cryogenics; Field programmable gate arrays; Gamma rays; Inductors; Large Hadron Collider; Microprocessors; Neutrons; Threshold voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532679
