DocumentCode
2410963
Title
Supervisory circuits in a mixed neutron and gamma radiation environment
Author
Zong, Y. ; Franco, F.J. ; Cachero, A.H. ; Agapito, J.A. ; Fernandes, A.C. ; Marques, J.G. ; Rodríguez-Ruiz, M.A. ; Casas-Cubillos, J.
Author_Institution
Dep. Fisica Aplicada III, Univ. Complutense de Madrid, Spain
fYear
2005
fDate
11-15 July 2005
Firstpage
132
Lastpage
137
Abstract
This paper describes the evolution of different commercial microprocessor supervisory circuits under neutron and gamma radiation. After the irradiation, the tested devices showed some interesting changes: an increase of supply current and the period of watchdog timer. It was also observed that threshold voltage hysteresis and the shift of TTL trigger level appeared in some devices.
Keywords
gamma-ray effects; hysteresis; integrated circuit testing; microprocessor chips; neutron effects; reference circuits; TTL trigger level shift; microprocessor supervisory circuits; mixed neutron-gamma radiation environment; supply current increase; threshold voltage hysteresis; watchdog timer; Circuit testing; Clocks; Cryogenics; Field programmable gate arrays; Gamma rays; Inductors; Large Hadron Collider; Microprocessors; Neutrons; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN
0-7803-9367-8
Type
conf
DOI
10.1109/REDW.2005.1532679
Filename
1532679
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