Title :
Total ionizing dose gamma and proton radiation testing on a COTS interline CCD with microlens
Author :
Lee, P.P.K. ; Thompson, D.A. ; Modney, D.L.
Author_Institution :
ITT Industries Space Syst. Div., Rochester, NY, USA
Abstract :
Commercially fabricated interline CCDs were total ionizing dose (TID) tested with gamma (γ) and proton (p+) radiation. Materials used for microlenses applied to the array surface were also irradiated on fused silica substrates. Device and material performance degradations are presented.
Keywords :
charge-coupled devices; gamma-ray effects; microlenses; proton effects; semiconductor device testing; COTS interline CCD; amplifier gain; charge transfer efficiency; dark current; fused silica substrates; gamma radiation testing; microlens materials; photodiode devices; proton radiation testing; quantum efficiency; total ionizing dose; Buffer layers; Charge coupled devices; Diodes; Ionizing radiation; Lenses; Microoptics; Photodiodes; Protons; Sensor arrays; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532684
