DocumentCode
2411895
Title
Qualifying reliable systems from unreliable components
Author
Haggag, Amr
Author_Institution
Freescale Semiconductor, USA
fYear
2010
fDate
17-21 Oct. 2010
Firstpage
85
Lastpage
85
Abstract
Summary form only given. In an era of increasing performance targets and ever more stringent power requirements, design margins are shrinking more than ever. It is therefore critical to be able to understand the factors which impact product reliability and to accurately predict their effects. Overestimate the impact of defects, variability, NBTI, HCI, TDDB and EM on the product, and critical performance or power is left on the table. Underestimate these effects and the product suffers an unacceptable failure rate. Further complicating this picture is the fact that the relative importance of these different degradation mechanisms can change drastically from one process generation to the next. It is shown how a combination of careful modeling combined with product measurement data is used to set the reliability screens and margins. The role of design in building-in reliability is then discussed to help qualify reliable systems from unreliable components.
Keywords
design for quality; integrated circuit reliability; critical performance; design margins; hot carrier injection; negative bias temperature instability; product reliability; reliability margins; reliability screens; time dependent dieletric breakdown; unacceptable failure rate;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report (IRW), 2010 IEEE International
Conference_Location
Stanford Sierra, CA
ISSN
1930-8841
Print_ISBN
978-1-4244-8521-5
Type
conf
DOI
10.1109/IIRW.2010.5706492
Filename
5706492
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