• DocumentCode
    2411895
  • Title

    Qualifying reliable systems from unreliable components

  • Author

    Haggag, Amr

  • Author_Institution
    Freescale Semiconductor, USA
  • fYear
    2010
  • fDate
    17-21 Oct. 2010
  • Firstpage
    85
  • Lastpage
    85
  • Abstract
    Summary form only given. In an era of increasing performance targets and ever more stringent power requirements, design margins are shrinking more than ever. It is therefore critical to be able to understand the factors which impact product reliability and to accurately predict their effects. Overestimate the impact of defects, variability, NBTI, HCI, TDDB and EM on the product, and critical performance or power is left on the table. Underestimate these effects and the product suffers an unacceptable failure rate. Further complicating this picture is the fact that the relative importance of these different degradation mechanisms can change drastically from one process generation to the next. It is shown how a combination of careful modeling combined with product measurement data is used to set the reliability screens and margins. The role of design in building-in reliability is then discussed to help qualify reliable systems from unreliable components.
  • Keywords
    design for quality; integrated circuit reliability; critical performance; design margins; hot carrier injection; negative bias temperature instability; product reliability; reliability margins; reliability screens; time dependent dieletric breakdown; unacceptable failure rate;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IRW), 2010 IEEE International
  • Conference_Location
    Stanford Sierra, CA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4244-8521-5
  • Type

    conf

  • DOI
    10.1109/IIRW.2010.5706492
  • Filename
    5706492