• DocumentCode
    2412035
  • Title

    Bistatic radar cross section of two-dimensional random rough layers in the high-frequency limit

  • Author

    Pinel, Nicolas ; Bourlier, Christophe ; Saillard, Joseph

  • Author_Institution
    Polytech ´´Nantes, Nantes
  • fYear
    2007
  • fDate
    9-12 Oct. 2007
  • Firstpage
    1542
  • Lastpage
    1545
  • Abstract
    Few fast asymptotic models have been developed on stacks of rough interfaces. Nevertheless, the specific case of very rough surfaces comparatively to the incident wavelength has not been treated before, which is the context of this paper. The model starts from the iteration of the Kirchhoff approximation to calculate the fields scattered by a rough layer, and is reduced to the high-frequency limit in order to fast obtain numerical results. The shadowing effect, important under grazing angles, is taken into account. The model can be applied to any given slope statistics. It is validated by comparison with a reference numerical method based on the method of moments, in the high- frequency limit for lossless and lossy inner media separating ID surfaces. Then, the model is extended to 2D surfaces.
  • Keywords
    absorbing media; electromagnetic wave scattering; method of moments; radar cross-sections; rough surfaces; Kirchhoff approximation; bistatic radar cross section; fast asymptotic model; field scatter calculation; method of moment; rough interfaces; shadowing effect; slope statistics; two-dimensional random rough layer; Bistatic radar; Kirchhoff´s Law; Moment methods; Radar scattering; Rough surfaces; Shadow mapping; Statistics; Surface roughness; Surface treatment; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2007. European
  • Conference_Location
    Munich
  • Print_ISBN
    978-2-87487-001-9
  • Type

    conf

  • DOI
    10.1109/EUMC.2007.4405501
  • Filename
    4405501